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US Patent Issued to KOKUSAI ELECTRIC on Aug. 11 for "Substrate processing apparatus, method of manufacturing semiconductor device, and recording medium" (Japanese Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,707,918, issued on Aug. 11, was assigned to KOKUSAI ELECTRIC Corp. (Tokyo). "Substrate processing apparatus, method of manufacturing semiconduc... Read More


US Patent Issued to Tokyo Electron on Aug. 11 for "Bonding apparatus and bonding method" (Japanese Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,707,919, issued on Aug. 11, was assigned to Tokyo Electron Ltd. (Tokyo). "Bonding apparatus and bonding method" was invented by Tokutarou Hayas... Read More


US Patent Issued to SCREEN Holdings on Aug. 11 for "Processing condition specifying method, substrate processing method, substrate product production method, computer program, storage medium, processing condition specifying device, and substrate processing apparatus" (Japanese Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,707,920, issued on Aug. 11, was assigned to SCREEN Holdings Co. Ltd. (Japan). "Processing condition specifying method, substrate processing met... Read More


US Patent Issued to Applied Materials on Aug. 11 for "Methods and assemblies for gas flow ratio control" (American, Indian Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,707,921, issued on Aug. 11, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "Methods and assemblies for gas flow ratio control" w... Read More


US Patent Issued to Applied Materials on Aug. 11 for "Determining a substrate location threshold based on optical properties" (Texas Inventor)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,707,922, issued on Aug. 11, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "Determining a substrate location threshold based on ... Read More


US Patent Issued to EBARA on Aug. 11 for "Substrate conveyance method, substrate processing device, and recording medium" (Japanese Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,707,923, issued on Aug. 11, was assigned to EBARA Corp. (Tokyo). "Substrate conveyance method, substrate processing device, and recording mediu... Read More


US Patent Issued to Applied Materials on Aug. 11 for "Systems and methods for detecting a substrate in a chamber of a substrate processing system" (California Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,707,924, issued on Aug. 11, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "Systems and methods for detecting a substrate in a c... Read More


US Patent Issued to SEMES on Aug. 11 for "Substrate processing apparatus and process control method thereof" (South Korean Inventor)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,707,925, issued on Aug. 11, was assigned to SEMES Co. LTD. (Cheonan-si, South Korea). "Substrate processing apparatus and process control metho... Read More


US Patent Issued to Tokyo Electron on Aug. 11 for "Data collection system, data collection apparatus, data collection method, and data collection program" (Japanese Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,707,926, issued on Aug. 11, was assigned to Tokyo Electron Ltd. (Tokyo). "Data collection system, data collection apparatus, data collection me... Read More


US Patent Issued to Gudeng Equipment on Aug. 11 for "Photomask box carrying device" (Taiwanese Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,707,927, issued on Aug. 11, was assigned to Gudeng Equipment Co. LTD. (New Taipei City, Taiwan). "Photomask box carrying device" was invented b... Read More